These modules compute the probability that a single ion from the environment
will hit two or more bits causing simultaneous errors. It will be useful
in cases where error processing has been used to identify and correct single-bit errors
and when it is not possible to assign bits within a word to different chips.
The module uses techniques developed by the Jet Propulsion Laboratory ¹ and has been
verified against flight data. ²
This package consists of four modules. Each allows you to estimate the multiple-bit error rate using a different set of parameters. The parameter sets are identical to [209] Heavy Ion SEU, with the addition of the bit separation.
¹
L.D. Edmonds, A Distribution Function for Double-Bit Upsets,
IEEE Trans. Nucl. Sci.
²
E.C. Smith and M. Shoga, Double Upsets from Glancing Collisions: A Simple Model
Verified with Flight Data,
IEEE Trans. Nucl. Sci.