Single-event upsets (SEUs) are random errors in semiconductor memory that occur at a much higher rate in space than on the ground. They are non-destructive, but can cause a loss of data if left uncorrected. SEUs are often associated with protons in intense regions of the radiation belts or solar flares.

Proton SEU

These SEUs occur indirectly when a proton passes through a semiconductor memory element and undergoes a nuclear reaction with the substrate. Four different methods are included depending on what SEU test data you have available.

• Empirical: Proton SEU cross section and energy
• Model: Bendel A and B parameters
• File: Text file containing proton SEU cross section as a function of energy
• Weibull: Proton upset threshold and saturation cross section, Weibull shape and width