Single-event upsets (SEUs) are random errors in semiconductor memory that occur at a much higher rate in space than on the ground. They are non-destructive, but can cause a loss of data if left uncorrected. SEUs are often associated with neutrons in the upper atmosphere and artificial environments.

Neutron SEU

These SEUs occur indirectly when a neutron passes through a semiconductor memory element and undergoes a nuclear reaction with the substrate. Three different methods are included depending on what heavy-ion SEU test data you have available.

• Empirical: LET threshold, SEU cross section, depth, funnel (optional)
• File: Text file containing SEU cross section as a function of LET, depth, funnel (optional)
• Weibull: Empirical parameters, Weibull width and shape